Method and system providing a self-test on one or more sensors coupled to a device
US9720794B2 · kind B2 · utility
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15Claims
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Key dates
| Filing date | Mar 13, 2015 |
| Grant date | Aug 1, 2017 |
| Priority date | — |
| Expiry date | Sep 22, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2273
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for providing a self-test configuration in a device is disclosed. The method and system comprise providing a self-test mechanism in a kernel space of a memory and enabling a hook in a user space of the memory, wherein the hook is in communication with the self-test mechanism. The method and system also include running the self-test driver and utilizing the results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.