Patent · US Active

Chemical mechanical planarization slurry composition comprising composite particles, process for removing material using said composition, CMP polishing pad and process for preparing said composition

US9725621B2 · kind B2 · utility

3Cited by
11References
28Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 30, 2014
Grant dateAug 8, 2017
Priority date
Expiry dateApr 30, 2034

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC09K3/1463
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

CMP processes, tools and slurries utilize composite particles that include core particles having organosilica particles disposed about the core particles. Using these processes, tools and slurries can enhance removal rates, reduce defectivity and increase cleanability with respect to comparable systems and substrates.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.