Chemical mechanical planarization slurry composition comprising composite particles, process for removing material using said composition, CMP polishing pad and process for preparing said composition
US9725621B2 · kind B2 · utility
3Cited by
11References
28Claims
0Family size
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Key dates
| Filing date | Apr 30, 2014 |
| Grant date | Aug 8, 2017 |
| Priority date | — |
| Expiry date | Apr 30, 2034 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC09K3/1463
- WIPO fieldBasic materials chemistry
- WIPO sectorChemistry
Abstract
CMP processes, tools and slurries utilize composite particles that include core particles having organosilica particles disposed about the core particles. Using these processes, tools and slurries can enhance removal rates, reduce defectivity and increase cleanability with respect to comparable systems and substrates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.