Maintenance management systems and methods

US9726715B2 · kind B2 · utility

Assignee

• Fluke Corporation · US

Inventors

• John Neeley · Seattle, US
• Jordan Schlichting · New Hope, US
• Thomas J. McManus · Plymouth, US
• Peter A. Bergstrom · Windom, US
• Lindsey Berdan · Seattle, US
• Joseph V. Ferrante · Redmond, US
• Michael D. Stuart · Issaquah, US

Key dates

• Filing date: Aug 3, 2012
• Grant date: Aug 8, 2017
• Expiry date: Jul 2, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F11/2294
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Systems and techniques for obtaining and maintaining maintenance records for various assets are described. In one embodiment, a computing device may be wirelessly coupled to a measurement device when the computing device is placed in proximity with the computing device. Upon measuring one or more parameters of a device under test (DUT), the measurement device may provide the measured parameters to the computing device in the form of measurement data. In some embodiments, the computing device associates the measured parameters with the corresponding DUT from which the measurements were obtained and provides the associated measured parameter to, for example, a service provider for future access. In another embodiment, the measurement device itself is configured to associate the measurement parameters with the DUT and provide the associated measurement parameters to the service provider.