Patent · US Active

Micromechanical component with a reduced contact surface and its fabrication method

US9731964B2 · kind B2 · utility

1Cited by
4References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 2, 2016
Grant dateAug 15, 2017
Priority date
Expiry dateJun 2, 2036

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2201/0198
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a silicon-based component with at least one reduced contact surface which, formed from a method combining at least one oblique side wall etching step with a “Bosch” etch of vertical side walls, improves, in particular, the tribology of components formed by micromachining a silicon-based wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.