Measurement of industrial products manufactured by extrusion techniques
US9733193B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 12, 2015 |
| Grant date | Aug 15, 2017 |
| Priority date | — |
| Expiry date | Sep 15, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/952
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to apparatus for monitoring an extruded product moving in an inline extrusion process so as to effect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation which is adapted to provide a curtain of parallel rays of the radiation which is scanned across the product as the product passes therethrough in a linear manner. The composition of the emitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters of the moving products. The imaging analysis involves applying correction values to the measured transit times of the rays crossing the products which depends on its position within the curtain of rays thereby to remove inaccuracies in the final measurement results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.