Method and device for testing an electronic appliance

US9733298B2 · kind B2 · utility

Assignee

• TAKATA CORPORATION · JP

Inventors

• Marcus Kandler · Aschaffenburg, DE
• Jan Salziger · Eßlingen, DE

Key dates

• Filing date: Aug 31, 2012
• Grant date: Aug 15, 2017
• Expiry date: Jan 21, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2829
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and a device for testing an electronic appliance for determining at least one variable of a system. The electronic appliance is designed in the form of a sensor. The method includes defining an expected minimum and/or maximum value of the variable and producing an electric signal by means of the electronic appliance depending on the variable. The method also includes detecting at least one value of a parameter of the produced electric signal and defining an expected minimum and/or maximum value of the parameter depending on the defined minimum and/or maximum value of the variable of the system. A determination is made, based on whether the detected value of the parameter is greater than the minimum value defined for the parameter and/or smaller than the maximum value, whether there is a malfunction of the electronic appliance provoked by an external electromagnetic interference field.