Reference calibration for an adaptive optics system
US9733474B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 29, 2016 |
| Grant date | Aug 15, 2017 |
| Priority date | — |
| Expiry date | Apr 29, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20048
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method of determining a reference calibration setting for an adaptive optics system (1) comprising a detecting device (8) for detecting light from an object (5); and at least one controllable wavefront modifying device (9) arranged such that light from the object (5) passes via the wavefront modifying device (9) to the detecting device (8). The method comprises the steps of: arranging (100) a light-source between the object (5) and the wavefront modifying device (9) to provide a reference light beam to the detecting device (8) via the wavefront modifying device; for each of a plurality of orthogonal wavefront modes of the wavefront modifying device: controlling (101) the wavefront modifying device to vary a magnitude of the orthogonal wavefront mode over a predetermined number of magnitude settings; acquiring (102) a series of readings of the detecting device, each reading corresponding to one of the magnitude settings; determining (103) a quality metric value indicative of an information content of the reading for each reading in the series of readings, resulting in a series of quality metric values; and determining (106) a reference parameter set for the wavefront modifying dev…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.