Method for generating high-resolution images using regression patterns
US9734558B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 20, 2014 |
| Grant date | Aug 15, 2017 |
| Priority date | — |
| Expiry date | Mar 20, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method generates a high-resolution (HR) image from a low-resolution (LR) image using regression functions. During a training stage, training HR images are downsampled to LR images. A signature is determined for each LR-HR patch pair based on a local ternary pattern (LTP). The signature is a low dimensional descriptor used as an abstraction of the patch pair features. Then, patch pairs with the same signature are clustered, and a regression function which maps the LR patches to the HR patches is determined. In some cases patch pairs of similar signatures can be combined for learning and a single regression function determined, thus decreasing the number of required regression functions. During actual upscaling, LR patches of an input image are similarly processed to obtain the signatures and from the regression functions. The LR patches can then be upscaled using the training regression functions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.