Patent · US Active

Pattern-based validation, constraint and generation of hierarchical metadata

US9736032B2 · kind B2 · utility

0Cited by
4References
19Claims
0Family size

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Key dates

Filing dateOct 6, 2014
Grant dateAug 15, 2017
Priority date
Expiry dateSep 5, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F3/04842
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A set of metadata defines a hierarchical structure. The metadata is compared against a pattern or sub pattern for the hierarchical structure. Comparison results are generated that show differences between a core structure defined by the pattern and a core structure in the hierarchical data, as well as content defined by a sub pattern, and content in the hierarchical structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.