Patent · US Active

Method and device for testing a workpiece

US9739826B2 · kind B2 · utility

0Cited by

14References

29Claims

0Family size

Assignee

KONRAD GMBH · DE

Inventors

Michael Konrad · Pfronten, DE
Stefan Werner · Halle (Saale), DE

Key dates

Filing date	Nov 21, 2013
Grant date	Aug 22, 2017
Priority date	—
Expiry date	Apr 3, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/06705
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for testing a workpiece (3), in particular a circuit board, by a test pin (2) arranged on a holder (1), the test pin (2) approaching a predetermined position on or in the workpiece (3), a position of the test pin (2) with respect to the holder (1) is intended to be changed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.