3-D polarimetric imaging using a microfacet scattering model to compensate for structured scene reflections
US9741163B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 22, 2015 |
| Grant date | Aug 22, 2017 |
| Priority date | — |
| Expiry date | Feb 23, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2200/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for more accurately generating the surface normal calibration maps φ(AoLP) and θ(DoLP,φ) to compensate for structured scene reflections for 3-D polarimetric imaging. This is accomplished using a microfacet scattering model to develop the functional form of a polarized bidirectional reflectance distribution function (BRDF) of the object surface. The ambient radiance is ray traced to the BRDF to create the calibration maps φ(AoLP) and θ(DoLP,φ), which may be combined into a single calibration map θ(DoLP, AoLP). These maps are applied to the AoLP and DoLP images to compute an array of surface normals, which are then mapped to form a 3-D image of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.