Systems and methods for calibrating multiple input, multiple output (MIMO) test systems and for using the calibrated MIMO test systems to test mobile devices
US9742508B1 · kind B1 · utility
15Cited by
1References
40Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2016 |
| Grant date | Aug 22, 2017 |
| Priority date | — |
| Expiry date | Feb 26, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/327
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
MIMO test systems and methods are provided that eliminate the need for a wired connection between the test system and the antenna ports of the DUT, thereby eliminating the need to open up the housing of the DUT and risk damaging or destroying it. The MIMO test systems and methods also eliminate the need for an anechoic chamber, thereby eliminating the cost and space requirements associated therewith. A suitable non-anechoic, electromagnetically-shielded chamber can be used in the test system that is much less expensive and that has a much smaller spatial footprint than a typical anechoic chamber used in MIMO test systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.