Communication interface testing
US9742654B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 24, 2014 |
| Grant date | Aug 22, 2017 |
| Priority date | — |
| Expiry date | Feb 22, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
Systems and methods are disclosed for testing performance of communications interfaces of computing devices. An electronic device tester is disclosed including a downstream communication interface configured to communicatively couple the electronic device tester to a device under test (DUT), wherein the electronic device tester is configured to identify a first internal hub of the DUT over the downstream communication interface, identify a second hub device connected to the DUT over a downstream interface port of the DUT, verify performance of the downstream interface port of the DUT at a first data rate by receiving data over a first downstream port of the second hub device via the downstream interface port of the DUT, and verify performance of the downstream interface port of the DUT at a second data rate by receiving data over a second downstream port of the second hub device via the downstream interface port of the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.