Method for detecting the interaction of at least one entity with a dielectric layer
US9746460B2 · kind B2 · utility
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Key dates
| Filing date | Oct 8, 2012 |
| Grant date | Aug 29, 2017 |
| Priority date | — |
| Expiry date | Oct 16, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/6489
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method of detecting the interaction between at least one entity and a dielectric layer containing different electron levels in the energy band gap of the dielectric layer, the method comprising the following steps:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.