Gas well integrity inspection system
US9746583B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Aug 27, 2014 |
| Grant date | Aug 29, 2017 |
| Priority date | — |
| Expiry date | May 30, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/145
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A well integrity inspection system configured to inspect a well structure including multiple concentric layers. The well integrity inspection system includes an inspection probe positioned in the well structure. The inspection probe includes a plurality of excitation assemblies for transmitting a plurality of radiation emissions into the well structure. The plurality of excitation assemblies includes at least a neutron excitation assembly and an X-ray excitation assembly. The inspection probe also includes a plurality of detection assemblies configured to receive a plurality of backscatter radiation returns from the well structure. The plurality of detection assemblies includes at least a neutron detection assembly and an X-ray detection assembly. The well integrity inspection system further including a processor operatively coupled to the inspection probe. The processor is configured to determine a well integrity parameter of the well structure based on at least one of the plurality of backscatter radiation returns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.