Virtual cluster meter (VCM)
US9747786B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 17, 2012 |
| Grant date | Aug 29, 2017 |
| Priority date | — |
| Expiry date | Apr 2, 2033 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY04S20/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A distributed metering platform virtualizes functions of a conventional metrology sensor and separates the virtualized functions from a metrology sensor. One or more virtual meters or applications may be instantiated at a network communication device that is remote from the metrology sensor and processes metrology data received from the metrology sensor. Each virtual meter may include multiple partitioned application spaces that are isolated from one another. In one example, a first application space includes a locked version of code and a second application space includes an unlocked version of code. Furthermore, each virtual meter may be isolated from other virtual meters such that each virtual meter is unable to affect operations and/or data associated with other virtual meters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.