Calibration method for a device having a scan function
US9752863B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 10, 2012 |
| Grant date | Sep 5, 2017 |
| Priority date | — |
| Expiry date | Apr 8, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/86
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device having a scan function comprising an electro-optical distance measuring element having a laser axis as the target axis, a motorized optical deflection unit, which deflects the target axis by a deflection angle, and an angle measuring element for determining at least one angular position of the deflection unit. First measurement of angle coordinates of a reticle in a first angular position of the deflection unit as the first position, and second measurement of angle coordinates of the reticle in a second angular position of the deflection unit as the second position. The first and second measurements of the reticle are carried out on the basis of images taken with a camera, the optical axis of which is deflected by the deflection unit, and calibration parameters are determined on the basis of the angular positions and the angular coordinates in the first and second positions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.