Methods for manufacturing and operating a memory device and a method for operating a system having the same
US9753849B2 · kind B2 · utility
3Cited by
6References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 7, 2015 |
| Grant date | Sep 5, 2017 |
| Priority date | — |
| Expiry date | Sep 9, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F12/1425
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for manufacturing a memory device includes detecting, with a tester, whether memory cells included in a memory device are defective, and programming, with the tester, start addresses of defect-free memory regions for addressing modes of the memory device based on a result of the detection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.