Patent · US Active

Question classification and feature mapping in a deep question answering system

US9754215B2 · kind B2 · utility

4Cited by

12References

14Claims

0Family size

Assignee

SINOEAST CONCEPT LIMITED · CN

Inventors

Adam T. Clark · Mantorville, US
Mark G. Megerian · Rochester, US
John E. Petri · Rochester, US
Richard J. Stevens · Tullibody, GB

Key dates

Filing date	Dec 17, 2012
Grant date	Sep 5, 2017
Priority date	—
Expiry date	Mar 26, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG06Q10/00
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

System, method, and computer program product to identify relevant features in a deep question answering system, by classifying a first case received by the deep question answering system, and, while training the deep question answering system to answer the first case, identifying a first feature in the first case, computing a first feature score for the first feature, the first feature score indicating a relevance of the first feature in generating a correct response to the first case, and, identifying the first feature as relevant in answering the classified first case upon determining that the first feature score exceeds a relevance threshold.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.