Panel inspecting apparatus and method
US9759665B2 · kind B2 · utility
1Cited by
9References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 14, 2015 |
| Grant date | Sep 12, 2017 |
| Priority date | — |
| Expiry date | May 24, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/9513
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A panel inspecting apparatus and method may accurately inspect image quality of a curved portion of a panel with relatively small inspecting cost and time, and the panel inspecting apparatus may have a relatively simple structure. The panel inspecting apparatus includes a support on which a panel is disposed, a mirror corresponding to a curved area of the panel, a lens configured to receive an image from the panel and an image reflected by the mirror and focus the images, and an image sensor configured to capture the images transferred via the lens.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.