Input/output cell, integrated circuit device and methods of providing on-chip test functionality
US9759765B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 28, 2014 |
| Grant date | Sep 12, 2017 |
| Priority date | — |
| Expiry date | Mar 21, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2217/0072
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An I/O cell comprising a first set of driver stages comprising, each driver stage of the first set comprising a high side switch controllable to couple an I/O node of the I/O cell to a first high voltage supply node and a low side switch controllable to couple the I/O node of the I/O cell to a first low voltage supply node. The I/O cell further comprising a second set of driver stages, each driver stage of the second set comprising a high side switch controllable to couple the I/O node of the I/O cell to a second high voltage supply node and a low side switch controllable to couple the I/O node of the I/O cell to a second low voltage supply node. The switches of the first set of driver stages are controllable independently of the switches of the second set of driver stages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.