Programmable test instrument

US9759772B2 · kind B2 · utility

Assignee

• Teradyne, Inc. · US

Inventors

• David Kaushansky · Winchester, US
• Lloyd K. Frick · Pepperell, US
• Stephen J. Bourassa · Tewksbury, US
• David Vandervalk · Chelmsford, US
• Michael Thomas Fluet · Litchfield, US
• Michael Francis McGoldrick · North Reading, US

Key dates

• Filing date: Oct 28, 2011
• Grant date: Sep 12, 2017
• Expiry date: Jan 20, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31926
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.