Method of preparing strain released strip-bent x-ray crystal analyzers
US9761340B2 · kind B2 · utility
2Cited by
0References
9Claims
0Family size
Inventor
Key dates
| Filing date | Sep 25, 2016 |
| Grant date | Sep 12, 2017 |
| Priority date | — |
| Expiry date | Sep 25, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F71/121
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of preparing two dimension bent X-ray crystal analyzers in strips feature is provided. A crystal wafer in strips is bonded to a curved substrate which offers the desired focus length. A crystal wafer in strips is pressed against the surface of the substrate forming curved shape by anodic bonding or glue bonding. The bonding is permanently formed between crystal wafer and its substrate surface, which makes crystal wafer has same curvature as previously prepared substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.