Apparatus and method for measuring pretilt angle of liquid crystal
US9766061B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 5, 2015 |
| Grant date | Sep 19, 2017 |
| Priority date | — |
| Expiry date | Jun 26, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/1393
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for measuring a pretilt angle of a liquid crystal (LC) are disclosed. The method includes irradiating polarized light on an LC cell including a first substrate, a second substrate facing the first substrate, and an LC layer between the first substrate and the second substrate. At least one of the first substrate and the second substrate includes a minute branch electrode. Irradiated light is scanned within a predetermined angle range in a direction not parallel to the minute branch electrode, an intensity of light that is transmitted through the LC cell is detected, and a pretilt angle of the LC is obtained by using a light intensity detection signal corresponding to the transmitted light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.