Ultrasonic probe for contact measurement of an object and its manufacturing process
US9766212B2 · kind B2 · utility
1Cited by
3References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2013 |
| Grant date | Sep 19, 2017 |
| Priority date | — |
| Expiry date | Jun 24, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2638
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ultrasonic probe for contact measurement of an object and its manufacturing process. The ultrasonic probe has ultrasonic sensors securely fastened to a first face of a substrate. The opposite face of the substrate defines a measurement surface having a shape that is the imprint of the surface of the object to be measured to closely follow the latter when the surface of the object is brought into contact with the measurement surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.