Method for electronically testing integrity of ideal diode components used in OR'd voltage bus
US9766299B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 19, 2015 |
| Grant date | Sep 19, 2017 |
| Priority date | — |
| Expiry date | Oct 1, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH02M3/158
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A power system includes a first power input, a second power input, a power output, a first ideal diode coupled to the a power input and a power output and a second ideal diode coupled to a second power input and the power output. The power system also includes a first switching circuit coupled to the first power input and the first ideal diode and a second switching circuit coupled to the second power input and the second ideal diode, the switching circuits operating as an open or a short circuit based on an input. The power system also includes a test controller coupled to the first switching circuit, the second switching circuit and the power output and configured to determine an operating status of the power system based on an input to the first switch, inputs to the second switch and the power output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.