Patent · US Active

Mask

US9766537B2 · kind B2 · utility

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0References
8Claims
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Key dates

Filing dateApr 14, 2015
Grant dateSep 19, 2017
Priority date
Expiry dateJun 21, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F1/54
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The present disclosure relates to the field of photolithography technologies. Disclosed is a mask comprising a transparent substrate, the transparent substrate being provided thereon with a semi-transmitting film layer and a light barrier layer to form a non-transmitting region, a semi-transmitting region, and a full transmitting region, the transparent substrate being further provided with a light extinction film layer located at a vicinity of the full transmitting region to weaken an intensity of ultraviolet light transmitting through the vicinity of the full transmitting region. The size of the via formed after an exposure process with the mask is less affected by a change in the thickness of the photoresist surrounding the via.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.