Patent · US Active

Phase control for dual atom interferometers

US9772175B2 · kind B2 · utility

6Cited by
1References
19Claims
0Family size

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Inventors

Key dates

Filing dateFeb 24, 2015
Grant dateSep 26, 2017
Priority date
Expiry dateNov 28, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C19/64
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for controlling a phase measurement in an atom interferometer comprising one or more lasers, a processor, and a memory. The one or more lasers are for providing interrogating beams. A first cloud of atoms and a second cloud of atoms traverse an interrogating region of the atom interferometer in substantially opposite directions. The interrogating beams interact substantially simultaneously with both atoms in the first cloud and atoms in the second cloud. The first cloud of atoms and the second cloud of atoms interact with each of the interrogating beams in a different order. The processor is configured to determine a phase adjustment offset of at least one interrogating beam based at least in part on one or more past interactions of one or more interrogating beams with either the first cloud of atoms or the second cloud of atoms.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.