Patent · US Active

Scanner for space measurement

US9778037B2 · kind B2 · utility

14Cited by

3References

13Claims

0Family size

Assignee

HEXAGON TECHNOLOGY CENTER GMBH · CH

Inventors

Simon BESTLER · Oberdorf, DE
Jochen Scheja · Hohenems, AT
Jürg Hinderling · Interlaken, CH

Key dates

Filing date	Oct 9, 2014
Grant date	Oct 3, 2017
Priority date	—
Expiry date	Dec 19, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01S17/89
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Some embodiments of the invention relate to a surveying apparatus in the form of a scanner comprising a beam deflection unit, such a beam deflection unit and a measuring method to be carried out with said surveying apparatus. The surveying apparatus comprises a radiation source for generating measurement radiation and a detector for receiving reflected measurement radiation, called reflection radiation for short, which was reflected at an object of interest, wherein measurement radiation and reflection radiation have substantially the same optical path. Situated in said optical path there is a beam deflection unit mounted rotatably about a rotation axis and serving for adjustably aligning the measurement radiation and for capturing the reflected radiation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.