Method for obtaining full reflectance spectrum of a surface and apparatus therefor
US9778109B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 12, 2014 |
| Grant date | Oct 3, 2017 |
| Priority date | — |
| Expiry date | Oct 2, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2806
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are a method for obtaining a full reflectance spectrum of a surface and an apparatus therefor. The method for obtaining a full reflectance spectrum of a surface, comprises the steps of: (a) calculating a combination value of spectral characteristics of a light source and response characteristics of a camera for an image of a reference object, the full reflectance spectrum of a surface of which is known, by utilizing the known full reflectance spectrum of a surface; (b) obtaining an image by photographing an object irradiated with light according to a predetermined lighting environment; and (c) obtaining a full reflectance spectrum of a surface for the object by utilizing the combination value of the spectral characteristics of the light source and the response characteristics of the camera for the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.