Patent · US Active

Grain quality monitoring

US9779330B2 · kind B2 · utility

17Cited by

6References

20Claims

0Family size

Assignee

Deere & Company · US

Inventors

Carl Knox Wellington · Pittsburgh, US
Aaron J. Bruns · Davenport, US
Victor S. Sierra · Waukee, US
James J. Phelan · Bettendorf, US
John M. Hageman · Silvis, US
Cristian Dima · Sankt Ingbert, DE
Hanke Boesch · Eisenberg (Pfalz), DE
Herman Herman · Gibsonia, US
Zachary Abraham Pezzementi · Pittsburgh, US
Cason Robert Male · Pittsburgh, US
Joan Campoy · Pittsburgh, US
Carlos Vallespi-Gonzalez · Wexford, US

Key dates

Filing date	Dec 26, 2014
Grant date	Oct 3, 2017
Priority date	—
Expiry date	Dec 26, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG06V20/68
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method and non-transitory computer-readable medium capture an image of bulk grain and apply a feature extractor to the image to determine a feature of the bulk grain in the image. For each of a plurality of different sampling locations in the image, based upon the feature of the bulk grain at the sampling location, a determination is made regarding a classification score for the presence of a classification of material at the sampling location. A quality of the bulk grain of the image is determined based upon an aggregation of the classification scores for the presence of the classification of material at the sampling locations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.