Non-invasive measurement of dielectric properties of a substance
US9784704B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 4, 2013 |
| Grant date | Oct 10, 2017 |
| Priority date | — |
| Expiry date | Mar 18, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/0053
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention pertains to an apparatus and a method for determining a dielectric property of a first substance in a composition in a non-invasive manner. The composition includes at least the first substance to be measured and a second substance. The method uses and apparatus includes a capacitor for creating a field into which the composition can be introduced at least in part, where the capacitor is part of an oscillator circuit, and the oscillator circuit is coupled to a device for determining the resonance frequency of the oscillator circuit. The capacitor includes a layer of a non-conducting material such that the composition, when introduced at least in part into the field of the capacitor, does not come into an electrical contact with the electrodes of the capacitor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.