Methods of determining the shape of a sessile drop
US9791265B2 · kind B2 · utility
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4References
25Claims
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Key dates
| Filing date | May 30, 2014 |
| Grant date | Oct 17, 2017 |
| Priority date | — |
| Expiry date | May 30, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N13/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In one aspect, methods of determining the shape of a sessile drop are described herein. In some embodiments, a method described herein comprises measuring a first shape parameter of a sessile drop to obtain a first shape parameter value, measuring a second shape parameter of the drop to obtain a second shape parameter value, and using the first and second shape parameter values to calculate a third shape parameter value of a third shape parameter of the drop.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.