System and method for imaging device modelling and calibration
US9792684B2 · kind B2 · utility
3Cited by
13References
16Claims
0Family size
Inventor
Key dates
| Filing date | Jul 2, 2014 |
| Grant date | Oct 17, 2017 |
| Priority date | — |
| Expiry date | Jul 2, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10024
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a camera modeling and calibration system and method using a new set of variables to compensate for imperfections in line of sight axis squareness with camera plane and which increases accuracy in measuring distortion introduced by image curvature caused by geometric and chromatic lens distortion and wherein the camera image plane is represented from a full 3D perspective projection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.