Calibration of microscopy systems
US9797767B2 · kind B2 · utility
3Cited by
7References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 26, 2014 |
| Grant date | Oct 24, 2017 |
| Priority date | — |
| Expiry date | Apr 19, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/365
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Approaches are disclosed for calibrating a plurality of imaging devices, such as microscopes. In certain implementations, a calibration plate is employed that include a variety of calibration features. Imaging devices calibrated in accordance with the present approaches may be used to generate images having consistent attributes, such as brightness, regardless of which imaging device is employed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.