Method for multiplexed sample analysis by photoionizing secondary sputtered neutrals
US9797879B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 20, 2016 |
| Grant date | Oct 24, 2017 |
| Priority date | — |
| Expiry date | May 17, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/162
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein is a method of generating a high resolution image of a cellular sample, the method including i) labeling a cellular sample with at least one mass tag, thereby producing a labeled sample in which a biological feature of interest is associated with the at least one mass tag, ii) scanning the sample with a continuous or near-continuous primary ion beam to generate sputtered secondary ions and sputtered neutral species, iii) photoionizing the sputtered neutrals to generate ionized neutral species, wherein the sputtered neutrals are photoionized at a site that is proximal to their source on the sample, iv) detecting the ionized neutral species by mass spectrometry, thereby obtaining spatially addressed measurements of the abundance of the at least one mass tag across an area of the sample, and v) producing an image of the sample using the measurements. A system for performing the method is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.