Supporting global effect analysis
US9798605B2 · kind B2 · utility
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1References
19Claims
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Key dates
| Filing date | Aug 18, 2014 |
| Grant date | Oct 24, 2017 |
| Priority date | — |
| Expiry date | Sep 3, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/0709
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The embodiments relate to methods and systems for supporting a global effect analysis of a technical system. The embodiments include providing a meta-model stored in a computer readable storage medium, where the meta-model comprises at least one assembly of the technical system comprising parts having an associated set of failure mode elements, and where each failure mode element has an associated local effect element. The embodiments also include clustering local effect elements within global effect elements to generate a global effect tree stored within the meta-model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.