Application retention metrics
US9798760B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 27, 2012 |
| Grant date | Oct 24, 2017 |
| Priority date | — |
| Expiry date | Jul 22, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q30/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The disclosure relates to methods and systems for generating application retention metrics. In one aspect, a method for generating coupled application retention metrics is disclosed. First and second reference application identifiers are selected (230), and a coupled application retention metric between the first and second reference application identifiers is generated (330). The coupled retention metric is generated by querying (100) an application database including a plurality of application records, where each record includes an application identifier, a user identifier, and retention information. Retention metrics in the application database are compared for application identifiers corresponding to the first or second reference application identifier and having a common user identifier. An application of interest is selected by and its identifier is received (200) from a user of a remote application, where the selected application corresponds to the first reference application identifier. The coupled application retention metric is transmitted (430) to the user.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.