X-ray phase-contrast imaging
US9801600B2 · kind B2 · utility
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16Claims
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Key dates
| Filing date | Nov 17, 2015 |
| Grant date | Oct 31, 2017 |
| Priority date | — |
| Expiry date | Feb 17, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2207/005
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
Systems and methods for X-ray phase-contrast imaging (PCI) are provided. A quasi-periodic phase grating can be positioned between an object being imaged and a detector. An analyzer grating can be disposed between the phase grating and the detector. Second-order approximation models for X-ray phase retrieval using paraxial Fresnel-Kirchhoff diffraction theory are also provided. An iterative method can be used to reconstruct a phase-contrast image or a dark-field image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.