Selecting feature geometries for localization of a device
US9803985B2 · kind B2 · utility
0Cited by
7References
20Claims
0Family size
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Key dates
| Filing date | Dec 26, 2014 |
| Grant date | Oct 31, 2017 |
| Priority date | — |
| Expiry date | Aug 17, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10028
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems, apparatuses, and methods are provided for developing a fingerprint database and selecting feature geometries for determining the geographic location of a device. A device collects a depth map at a location in a path network. Two-dimensional feature geometries from the depth map are extracted using a processor of the device. The extracted feature geometries are ranked to provide ranking values for the extracted feature geometries. A portion of the extracted feature geometries are selected based upon the ranking values and a geographic distribution of the extracted feature geometries.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.