Defect detection device and production system
US9805457B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 8, 2014 |
| Grant date | Oct 31, 2017 |
| Priority date | — |
| Expiry date | Jul 8, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a defect detection device capable of measuring the volume of surface defects. The defect detection device includes: an imaging device configured to image an image of an inspection object; a binarization processing unit configured to subject the image to first and second binarization processing by use of different first and second binarization thresholds, so as to calculate first and second sizes for an identical defect in the image; a ratio calculation unit configured to calculate a first ratio of the second size to the first size; and a depth determination unit configured to determine a depth of the defect depending on the first ratio.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.