Method for detecting influence on laser from back-reflection light of laser and detection device
US9806493B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 13, 2016 |
| Grant date | Oct 31, 2017 |
| Priority date | — |
| Expiry date | Sep 13, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0656
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The present invention discloses a method for detecting influence on a laser from back-reflected light of the laser and a detection device. The method includes: receiving laser light input by a laser; splitting the input light into first detection light and second detection light via a beam coupler having a specific distribution proportion, and outputting the first detection light and the second detection light to a first optical power meter and an adjustable reflector, respectively; receiving a part of the second detection light reflected by the adjustable reflector, splitting the part of the second detection light reflected by the adjustable reflector into first back-reflection light and second back-reflection light, and returning the first back-reflection light and the second back-reflection light to the laser and the first optical power meter, respectively, detecting power of the first detection light by using the first optical power meter, and detecting power of the second back-reflection light by using a second optical power meter, and calculating power of the input light of the laser and power of the first back-reflection light, and establishing a power corresponding relation…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.