Frequency offset detection and correction in optical spectrum measurement systems
US9806803B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2016 |
| Grant date | Oct 31, 2017 |
| Priority date | — |
| Expiry date | Mar 31, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/07957
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A frequency offset detection method in an optical spectrum measurement device, implemented by a controller, includes determining a reference optical spectrum based on expected channels and their associated spectral occupancy without extracting any information from actual received optical spectrum; obtaining a measured optical spectrum from the optical spectrum measurement device; and performing a frequency offset control loop using the reference optical spectrum and the measured optical spectrum to correct frequency offset in the optical spectrum measurement device. The optical spectrum measurement device can be an Optical Channel Monitor and the measured optical spectrum can include optical channels partially overlapping one another in Nyquist or in super-Nyquist spacing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.