Patent · US Active

Measuring probe for measuring a three-dimensional shape of an object to be measured

US9810529B2 · kind B2 · utility

5Cited by
14References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 1, 2015
Grant dateNov 7, 2017
Priority date
Expiry dateJul 1, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measuring probe includes a stylus having a contact part to be in contact with an object to be measured, an axial motion mechanism having a moving member that allows the contact part to move in an axial direction, and a rotary motion mechanism having a rotating member that allows the contact part to move along a plane perpendicular to the axial direction by means of rotary motion. The measuring probe includes a main body housing that supports the axial motion mechanism, a module housing that supports the rotary motion mechanism, and a displacement detector supported by the main body housing for detecting displacement of the moving member. The measuring probe with this configuration ensures high measurement accuracy while keeping a low cost.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.