Patent · US Active

High impedance compliant probe tip

US9810715B2 · kind B2 · utility

9Cited by

42References

17Claims

0Family size

Assignee

Tektronix, Inc. · US

Inventors

Julie A. Campbell · Beaverton, US
Ira G. Pollock · Beaverton, US
William A. Hagerup · Portland, US
Christina D. Enns · Beaverton, US

Key dates

Filing date	Dec 31, 2014
Grant date	Nov 7, 2017
Priority date	—
Expiry date	Apr 14, 2035

Classification

Technology area (CPC H)Electricity
CPC primaryH03F1/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.