Systems, devices and methods for quality monitoring of deposited films in the formation of light emitting devices
US9812672B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 29, 2016 |
| Grant date | Nov 7, 2017 |
| Priority date | — |
| Expiry date | Aug 29, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K71/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
This disclosure provides techniques for assessing quality of a deposited film layer of an organic light emitting diode (“OLED”) device. An image is captured and filtered to identify a deposited layer that is to be analyzed. Image data representing this layer can be optionally converted to brightness (grayscale) data. A gradient function is then applied to emphasize discontinuities in the deposited layer. Discontinuities are then compared to one or more thresholds and used to ascertain quality of the deposited layer, with optional remedial measures then being applied. The disclosed techniques can be applied in situ, to quickly identify potential defects such as delamination before ensuing manufacturing steps are applied. In optional embodiments, remedial measures can be taken dependent on whether defects are determined to exist.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.