Measurement device
US9817032B2 · kind B2 · utility
9Cited by
39References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 16, 2013 |
| Grant date | Nov 14, 2017 |
| Priority date | — |
| Expiry date | Nov 17, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To provide a measurement device which allows long-term accurate measurement of voltage without adversely affecting a device under test, by ensuring a predetermined level of resistance to ESD and reducing leakage current. A measurement device includes a probe needle for contacting a device under test, a first FET for detecting voltage of the device under test, and a protection circuit for protecting the first FET from static electricity. The protection circuit includes a second FET having an oxide semiconductor film as a channel formation region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.