Image sensor power supply noise detection
US9817048B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 9, 2015 |
| Grant date | Nov 14, 2017 |
| Priority date | — |
| Expiry date | May 5, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A power supply noise measurement circuit includes a multiphase filter coupled to receive a power supply signal. The multiphase filter is coupled to output a first filtered power supply signal for a first phase, and a second filtered power supply signal for a second phase. A multiphase amplifier is coupled to the multiphase filter to sample offset voltages in response to the first filter power supply signal during the first phase to set up DC operation points in the multiphase amplifier, and generate an amplified power supply noise signal during the second phase. An overshoot detector is coupled to the multiphase amplifier to detect overshoot events in the amplified power supply noise signal, and an undershoot detector is coupled to the multiphase amplifier to detect undershoot events in the amplified power supply noise signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.