Method and apparatus for testing a transformer
US9817053B2 · kind B2 · utility
3Cited by
8References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2014 |
| Grant date | Nov 14, 2017 |
| Priority date | — |
| Expiry date | Jun 18, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/62
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
For testing a transformer (20) the transformer (20) is emulated by an equivalent circuit (30) and an accuracy of the transformer (20) relative to the equivalent circuit (30) is determined by evaluating a test response of the transformer (20) and is then automatically converted to an operating condition-related accuracy of the transformer (20).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.