Method and apparatus for estimating depth of focused plenoptic data
US9818199B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 26, 2015 |
| Grant date | Nov 14, 2017 |
| Priority date | — |
| Expiry date | Dec 28, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20228
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Method and apparatus for estimating the depth of focused plenoptic data are suggested. The method includes: estimating the inherent shift of in-focus pixels of the focused plenoptic data; calculating a level of homogeneity of the pixels of the focused plenoptic data; determining the pixels of the focused plenoptic data which either have disparities equal to the inherent shift or belong to homogeneous areas, as a function of the level of homogeneity of the pixels of the focused plenoptic data; and estimating the depth of the focused plenoptic data by a disparity estimation without considering the determined pixels. According to the disclosure, the pixels of the focused plenoptic data which either have a disparity equal to the inherent shift or belong to a homogeneous area will not be considered for the estimation of the depth, which can reduce computational costs and at the same time increase accuracy of estimations for in-focus parts of the scene.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.